SMM3000X — Source Measure Units
Precision source-measure units for semiconductor I-V characterisation, pulsed device testing, sweep/list operation and material research. The series combines voltage source, current source, voltmeter, ammeter and resistance measurement in one four-quadrant instrument.
| Model | Channels | Source / Measure Range | Pulse Current | Resolution | Display |
|---|---|---|---|---|---|
| SMM3311X | Single channel | ±210 V / ±3.03 A DC / 31.8 W | ±10.5 A | 10 fA / 100 nV | 5-inch touch |
| SMM3312X | Dual channel | ±210 V / ±3.03 A DC / 31.8 W per channel | ±10.5 A | 10 fA / 100 nV | 5-inch touch |
Key Features
Source and Measure in One Instrument
Combines voltage sourcing, current sourcing, voltage measurement, current measurement and resistance measurement for clean I-V characterisation without separate source and meter wiring.
6½ Digits with 10 fA / 100 nV Resolution
High display resolution and fine programming resolution support low-current devices, leakage testing, nano-scale materials and semiconductor parameter extraction.
±210 V and ±3.03 A DC Source Capability
Wide voltage and current coverage supports diodes, MOSFETs, BJTs, sensors, optoelectronic devices and two-terminal material samples from low-level leakage to higher-current operating points.
50 μs Minimum Pulse Width
Pulse mode with ±10.5 A pulsed current helps test power devices and reduce self-heating during transient I-V measurement of GaN, SiC and other power semiconductor devices.
Linear, Logarithmic and List Operation
Generate sweep curves and custom source sequences for diode curves, transistor transfer/output curves, stress profiles and multi-step device test procedures.
Fast Acquisition and Timestamped Storage
Up to 100,000 points/s acquisition and internal storage with timestamps support pulsed response, transient behaviour and repeatable automated characterisation.
Graph, Roll and Numeric Views
Built-in views help inspect curves and time-domain behaviour directly on the 5-inch touch display before exporting or automating the measurement flow.
USB, LAN and SCPI Remote Control
Remote command control supports bench automation, semiconductor test scripts, network operation and integration into university or R&D characterisation setups.
Specifications
| Parameter | Unit | Value / Description |
|---|---|---|
| CORE SMU FUNCTION | ||
| Instrument type | — | Four-quadrant source measure unit |
| Basic functions | — | Voltage source · current source · voltage measurement · current measurement · resistance measurement |
| Display digits | — | 6½ digits, 2,100,000 count |
| SOURCE / MEASURE RANGE | ||
| Voltage source / measurement | V | ±210 |
| DC current source / measurement | A | ±3.03 |
| Pulsed current output | A | ±10.5 |
| Maximum output power | W | 31.8 |
| Minimum programming / measurement resolution | — | 10 fA / 100 nV |
| ACQUISITION AND TIMING | ||
| Maximum acquisition rate | points/s | 100,000 |
| Minimum trigger interval | μs | 10 |
| Minimum pulse width | μs | 50 |
| Internal storage | points | Up to 100k with timestamps |
| OUTPUT MODES AND CONTROL | ||
| Output modes | — | DC · pulse · scanning · list |
| Sweep types | — | Linear and logarithmic sweep |
| Remote control | — | USB · LAN · Web Server · SCPI |
| Display | — | 5-inch capacitive touch screen, graphic and digital views |
Applications
Diode and Transistor I-V
Generate transfer, output, leakage and breakdown-style characterisation curves for semiconductor devices.
GaN and SiC Pulse Testing
Use short pulses and high pulsed current to reduce self-heating during transient device characterisation.
Nano-scale and Organic Materials
Low-current resolution supports material samples, organic semiconductors, thin films and sensor structures.
Device Stress and Sequencing
List mode and custom sequencing support multi-step stress, recovery and endurance measurement flows.
Automated Component Screening
SCPI control enables repeatable current-voltage screening and binning of electronic components.
Advanced Semiconductor Lab
Suitable for teaching source-measure concepts, I-V curves, leakage, sweep modes and four-quadrant operation.
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