Low-current integrity
Leakage and sub-nanoampere measurements depend on guarding, shielding, settling time, cable leakage and fixture cleanliness—not only instrument resolution.
Semiconductor & Electronics
Primionics supplies source-measure instrumentation, RF and mixed-signal test platforms, automated data acquisition, software-assurance tools and cleanroom monitoring technologies to semiconductor and electronics teams in India. The portfolio addresses wafer-level I–V and leakage characterization, component validation, reliability studies, test automation and contamination-sensitive manufacturing.
Industry context
Reliable characterization depends on the complete measurement chain.
Multi-channel repeatability
Parallel characterization requires synchronized channels, controlled switching, stable common connections and traceable test sequences.
Clean process conditions
Airborne particles, airflow and filtration performance influence sensitive fabrication, assembly, inspection and packaging areas.
Core technology areas
Semiconductor test, characterization and clean manufacturing technologies.
Wafer & Device Characterization
SMU-based I–V, leakage, breakdown, switching and reliability measurements for wafers, coupons, packaged devices and materials.
Electronic & RF Validation
Oscilloscopes, spectrum and network analyzers, signal sources, power instruments and probes for analog, digital, RF and power-electronics validation.
Laboratory Automation
Instrument control, switching, synchronized acquisition, test sequencing and structured data export for repeatable characterization.
Clean Manufacturing & Monitoring
Portable and remote particle counting, airflow measurement, aerosol generation and filter-integrity instrumentation for controlled environments.
Primionics solutions
Measurement and monitoring platforms for semiconductor and electronics development.
Source-measure and parametric testing
Programmable sourcing and measurement for I–V sweeps, leakage, breakdown, pulsed tests and multi-channel device characterization.
Oscilloscopes, analyzers and signal sources
Time-domain, frequency-domain, RF and mixed-signal instruments for circuit, device and subsystem validation.
Power and component evaluation
Power supplies, electronic loads, power analysis and data acquisition for converters, power devices and embedded electronics.
Automated measurement systems
Python- or platform-based instrument control, switching, synchronization, data capture and repeatable operator workflows.
Cleanroom monitoring
Portable and remote particle counting, environmental trending, alarm handling and airflow measurement for controlled areas.
Software assurance for electronics
Requirements, automated testing, static analysis and embedded-security technologies for electronics-intensive products.
Applications
Semiconductor and electronics applications.
Wafer-level and coupon-level characterization
Power, analog, memory and sensor device evaluation
Electronics design and validation laboratories
Failure analysis and reliability engineering
Pilot lines, clean assembly and advanced packaging
University semiconductor and electronics research
Measurement performance
Low-noise characterization from device contact to recorded result.
Low-current accuracy
Guarded signal paths, low-leakage cabling, controlled settling and suitable fixtures protect picoampere- and nanoampere-level measurements.
Multi-channel consistency
Synchronized SMU channels, defined common returns and controlled switching reduce channel-to-channel variation in parallel tests.
Automated throughput
Sequenced sourcing, switching, wafer-map or device indexing and structured export turn manual measurements into repeatable workflows.
Traceable data
Stored setups, calibration status, test parameters and raw results preserve comparability across devices, wafers and test runs.
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