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SIGLENT SDG2000X Series

SDG2000X — 80–120 MHz AWG with 16-bit DAC and IQ Output

Advanced dual-channel AWG — 16-bit DAC, 1.2 GSa/s, IQ modulation output and wideband noise generation for RF testing, ADC characterisation and complex signal simulation.

Max Frequency
80 / 120 MHz
DAC
16-bit
Sample Rate
1.2 GSa/s
IQ Output
Yes
80–120 MHz16-bit DAC1.2 GSa/sIQ output
ModelMax FrequencyDACSample RateIQ Output
SDG2082X80 MHz16-bit1.2 GSa/sYes
SDG2122X120 MHz16-bit1.2 GSa/sYes

Key Features

16-bit DAC — 65,536 Amplitude Levels

Four times the resolution of 14-bit generators. Lower harmonic distortion and improved SFDR for precision RF carrier simulation and ADC characterisation.

IQ Modulation Output

Map Ch1 to I and Ch2 to Q for complex baseband signal generation — simulate OFDM, QAM and custom modulation for RF transceiver validation.

Wideband Noise Generation

Bandlimited Gaussian noise with programmable bandwidth and amplitude for noise immunity testing and ADC noise floor measurement.

1.2 GSa/s — Deep Arbitrary Waveforms

1.2 GSa/s with large arb memory enables complex long-sequence signal playback for serial data patterns and radar chirp sequences.

Specifications

ParameterUnitValue / Description
FREQUENCY
Max frequencyMHz80 (SDG2082X) · 120 (SDG2122X)
OUTPUT
DACbit16
Sample rateGSa/s1.2
IQ depthptsUp to 16 M per channel
MODULATION
TypesAM · DSB-AM · FM · PM · ASK · FSK · PSK · PWM
IQI/Q channel mapping via Ch1 and Ch2

Applications

IQ Baseband Generation

Generate IQ baseband for RF transceiver testing — upload custom modulation data.

ADC SNR and ENOB

High-fidelity 16-bit sinusoidal input for ADC characterisation.

Wideband Noise Testing

Generate AWGN for noise immunity and EMC susceptibility testing.

Automated Test Source

SCPI-controlled production test stimulus.

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