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SIGLENT SDG7000A arbitrary waveform generator front view
SIGLENT SDG7000A waveform generator touch display
SIGLENT SDG7000A arbitrary waveform and modulation interface
SIGLENT SDG7000A pulse and high-speed signal generation workflow
SIGLENT SDG7000A differential and single-ended signal source setup
SIGLENT SDG7000A Series

SDG7000A Series — Arbitrary Waveform Generator

Dual-channel arbitrary waveform generator family for high-speed analog stimulus, pulse generation, vector-signal creation and digital-bus workflows. The series reaches up to 1 GHz bandwidth with 5 GSa/s sampling, 14-bit vertical resolution and 512 Mpts waveform memory.

Bandwidth
350 MHz / 500 MHz / 1 GHz
Sample Rate
5 GSa/s max.
Resolution
14-bit
Memory
512 Mpts
Dual-channel5 GSa/s14-bit512 MptsDifferential / single-ended
ModelMax Output FrequencySample RateVertical ResolutionWaveform LengthChannels
SDG7032A350 MHz5 GSa/s14-bit512 Mpts2 differential / single-ended
SDG7052A500 MHz5 GSa/s14-bit512 Mpts2 differential / single-ended
SDG7102A1 GHz5 GSa/s14-bit512 Mpts2 differential / single-ended

Key Features

Up to 1 GHz Dual-channel AWG

The SDG7000A family covers 350 MHz, 500 MHz and 1 GHz models with dual-channel differential or single-ended outputs for RF, pulse, modulation and embedded-system stimulus.

5 GSa/s Sampling and 14-bit Resolution

The high-speed sampling system and 14-bit vertical resolution support cleaner waveform synthesis than lower-resolution arbitrary/function generators in demanding lab work.

TrueArb Point-by-point Arbitrary Generation

Adjustable arbitrary waveform sample rates from 0.01 Sa/s to 2.5 GSa/s allow point-by-point waveform playback without forcing all signals into fixed DDS-style frequency relationships.

Pulse, PRBS and Digital-bus Workflows

Low-jitter pulses with 1 ns minimum pulse width, 500 ps edge capability, PRBS up to 312.5 Mbps and optional 16-bit LVTTL/LVDS digital output support mixed analog/digital test needs.

Wide Output Swing

The analog output supports up to 24 Vpp with ±12 Vdc offset, giving a maximum ±24 V output range for applications that would otherwise require an external power amplifier.

Automation-ready Bench Instrument

10 MHz reference input/output, trigger input/output, marker synchronization, WebServer control and SCPI command support make the generator suitable for automated and synchronized test systems.

Specifications

ParameterUnitValue / Description
MODEL RANGE
SDG7032AMHz350 max output frequency
SDG7052AMHz500 max output frequency
SDG7102AGHz1 max output frequency
Channels2 differential / single-ended
SAMPLING / MEMORY
Maximum sample rateGSa/s5
Vertical resolutionbit14
Waveform memoryMpts512
TrueArb sample-rate rangeSa/s0.01 to 2.5 GSa/s
WAVEFORM / MODULATION
Vector-signal generationMSa/sUp to 500
Pulse widthns1 minimum
Pulse edgeps500 minimum; 100 ps fine step
PRBSMbpsUp to 312.5
Digital busOptional 16-bit LVTTL / LVDS up to 1 Gbps
OUTPUT / CONTROL
Analog output rangeV24 Vpp with ±12 Vdc offset; maximum ±24 V range
Display5-inch capacitive touch screen, 800 × 480
Reference / sync10 MHz In/Out, Trigger In/Out and Marker sync
Remote controlWebServer and SCPI command support

Applications

Vector-signal and IQ Stimulus

Create custom IQ, OFDM and modulated test signals for RF module and receiver evaluation within the SDG7000A bandwidth range.

High-voltage Stimulus

Use the wide output swing for gate-drive, control-loop, sensor-emulation and hardware-in-the-loop style stimulus where ordinary AWG amplitude is not enough.

Pulse and PRBS Generation

Generate fast pulses, PRBS patterns and optional 16-bit LVTTL/LVDS digital patterns for embedded and digital interface validation.

Advanced Signal-generation Lab

Teach arbitrary waveform generation, modulation, pulse timing, spectral purity and synchronization using one bench platform.

Arbitrary Waveform Playback

Replay measured or simulated waveforms using segmented playback and point-by-point arbitrary generation for product debug.

Production Test Stimulus

Use SCPI and synchronization ports to integrate repeatable stimulus generation into automated test racks.

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