Home Test & Measurement Vector Network Analysers SNA5000X-E Series
SIGLENT SNA5000X-E compact vector network analyzer front view
SIGLENT SNA5000X-E VNA measurement interface
SIGLENT SNA5000X-E S-parameter analysis display
SIGLENT SNA5000X-E compact bench and production setup
SIGLENT SNA5000X-E rear interface and connectivity view
SIGLENT SNA5000X-E Series

SNA5000X-E Series — Compact Vector Network Analyzer

Compact entry-level 2-port VNA platform for RF R&D, education, production and quality inspection. The series covers 9 kHz to 3 GHz or 6.5 GHz with 1 Hz frequency resolution, 1 Hz to 10 MHz IFBW, internal bias-tee connections and a compact 12.6 cm-deep chassis.

Frequency Range
9 kHz – 3 / 6.5 GHz
Ports
2-port VNA
IFBW
1 Hz – 10 MHz
Compact Chassis
12.6 cm depth · <5.4 kg
Compact VNA9 kHz–6.5 GHz2-portBias-tee std.12.1-inch touch
ModelFrequency RangePortsDynamic RangeOutput Range
SNA5003X-E9 kHz – 3 GHz2-port117 dB listed / 125 dB typ. platform-40 dBm to 0 dBm
SNA5006X-E9 kHz – 6.5 GHz2-port117 dB listed / 125 dB typ. platform-40 dBm to 0 dBm

Key Features

Compact Entry-level VNA Platform

Designed as a cost-effective SNA5000-series entry model, the SNA5000X-E keeps the core VNA architecture while reducing bench depth and weight for education, R&D benches and production cells.

9 kHz to 6.5 GHz Coverage

The 3 GHz and 6.5 GHz models cover common RF component, filter, antenna, matching-network and wireless hardware validation tasks without moving into higher-cost microwave VNA ranges.

Full 2-port S-parameter Workflows

Supports scattering-parameter, differential-parameter and receiver measurements with calibration workflows including response, enhanced response, full one-port, full two-port and TRL calibration.

Fixture Error Compensation

Fixture removal, port extension, de-embedding, adapter removal/insertion and impedance conversion help reduce systematic error from test cables, fixtures and adapters.

Time-domain and Spectrum-analysis Options

Optional time-domain, enhanced time-domain and spectrum-analysis functions extend the instrument into fault-location, signal-integrity and RF debugging workflows.

Automation-ready Interfaces

LAN, USB Device, USB Host and USB-GPIB support remote control through SCPI, LabVIEW, IVI, VXI-11, socket, Telnet and WebServer workflows.

Specifications

ParameterUnitValue / Description
MODEL RANGE
SNA5003X-EGHz0.000009 to 3
SNA5006X-EGHz0.000009 to 6.5
Ports2-port
FREQUENCY / IF
Frequency resolutionHz1
IF bandwidthHz1 to 10 M
SOURCE / DYNAMIC RANGE
Output setting rangedBm-40 to +10 platform range; model table lists -40 to 0
Level resolutiondB0.05
Dynamic rangedB125 typ. platform; model table lists 117
MEASUREMENT / ANALYSIS
S-parameter workflowsScattering-parameter, differential-parameter and receiver measurements
Advanced functionsTime-domain analysis, enhanced time-domain analysis, impedance conversion, fixture simulation, adapter removal/insertion and spectrum analysis
Calibration typesResponse, enhanced response, full one-port, full two-port and TRL calibration
Internal bias-teeStandard
DISPLAY / PHYSICAL
Display12.1-inch touch screen
Depthcm12.6
Weightkg<5.4
Video outputHDMI
CONNECTIVITY
InterfacesLAN · USB Device · USB Host · USB-GPIB
Remote controlSCPI · LabVIEW · IVI over USB-TMC, VXI-11, socket, Telnet and WebServer

Applications

RF and Microwave Teaching Labs

Compact 2-port VNA for S-parameter, Smith chart, filter, antenna and transmission-line experiments without occupying a full RF bench.

Antenna and Matching Network Design

Measure return loss, impedance, VSWR and matching-network behaviour for sub-6 GHz RF modules and antennas.

Filter and Duplexer Characterization

Use S11/S21 and marker workflows for pass-band, stop-band, insertion-loss and bandwidth checks.

Automated RF Component Test

SCPI and WebServer control support repeatable filter, cable, connector and module acceptance testing.

Time-domain Debugging

Optional time-domain functions help locate impedance discontinuities and fixture/cable-related faults.

Incoming Inspection

Compact footprint and automated workflows make it suitable for QC inspection of RF components and assemblies.

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